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厂家对老化房测试功能说明解析

发布时间:2018-12-12人气:65

老化房测试功能说明:1、系统老化完毕自动生成EXCEL报表,永久保存老化房资料。2、系统带有调试小工具,方便用户维护本系统。3、系统软体採用免安装技术,直接把文件拷贝电脑即可使用。4、系统具有齐全的用户管理功能,进行相关的操作时系统都会对用户使用权限进行安全性验证,如机种新增,修改确认、机种删除、老化房测试操作等均设有权限控制。

Testing function description of aging room: 1. Automatically generate EXCEL report forms after the aging of the system, and permanently preserve the data of aging room. 2. The system has debugging tools to facilitate users to maintain the system. 3. The system software adopts installation-free technology and can be used directly by copying files to a computer. 4. The system has a complete user management function. When operating, the system will verify the security of user's use rights, such as adding new types of machines, modifying and confirming, deleting types of machines, aging test operations and so on. 

5、本系统提供电压採集模块,I/O模块。

5. The system provides voltage acquisition module and I/O module.

6、系统可以实时控制每个?#23548;?#30340;输入测试电压的ACON/OFF﹐90VAC﹐110VAC﹐230VAC﹐264VAC切换﹐监视ON/OFF的状态,本系统可做动态电阻切换﹐及PS-ON信号控制.

6. The system can control the ACON/OFF, 90VAC, 110VAC, 230VAC, 264VAC switching of input test voltage of each frame in real time, and monitor the state of ON/OFF. The system can do dynamic resistance switching and PS-ON signal control.

7、系统提供坏机报警功能。

7. The system provides the alarm function of breakdown.

8、系统提供完善的机种?#38382;?#35774;定模块(需要测试通道的电压上下限,标準值,老化时间,ACON/OFF等).ACON/OFF的时间可按用户要求?#25105;?#35774;定.在设定时為所见即所得,其波形可总时间显示,单个週期显示,放大,缩小等。

8. The system provides a complete set module of parameters for different types of machines (including the upper and lower voltage limits of test channels, standard values, aging time, ACON/OFF, etc.). The time of ACON/OFF can be set arbitrarily according to user's requirements. When set, the waveform of ACON/OFF can be displayed in total time, single period, amplification and reduction, etc.

9、系统老化过程中能以图形的方式直观的显示老化进程(ACON/OFF波形变化),并能以图形方式显示机台的测试记录(相关的测试记?#23478;?#24102;区的?#38382;?#34920;达),并可生成报表。

9. The aging process of the system can be visualized graphically (ACON/OFF waveform changes), and the test records of the machine can be displayed graphically (related test records can be expressed in the form of zones), and report forms can be generated.

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